Material Characterization

Material Characterization

 Beckman Coulter
 Elementar
 Nikon
 Rigaku
 Setaram
 SpexSmaplePrep
 Surface Measurement Systems
 VLM

Ramcon offers various equipment and accessories for material and particle characterization and measurement. 
Particle sizes, size distribution, light scattering zeta potential , XRF, XRD, x-ray diffraction, x-ray flourescence, freezer mills and fluxers. 
Laser diffraction, vapor sorption, adsorption/desorption, corrosion testing, salt spray test, crystallinity, scanning electron microscope, stereo microscope, measurement microscope, inverted microscope and digital microscopes.
With a robust organisation of specialists, service technicians and supporters, Ramcon aids customers in a fast implementation of equipment within the lab, resulting in faster and better results.

 

Products

6875 Large FreezerMill, single chamber

Advanced Cyclic Corrosion

Advantage Elevated Temperature

Andor Technology

Condensation chambers

CoolLed illumination

Cyclic Corrosion Tests (CCT)

DelsaMax Zetapotential

DSC131 EVO

Dvs Advantage

DVS Intrinsic

DVS Vacuum

iGC-SEA Surface Energy Analyser

Inorganic Elemental Analysis

Inspectis C12

Kesternich (SO2) chambers

LABSYS EVO TGA

LS 13 320 XR - Laser Diffraction

MCT225

MICRODSC7 EVO

MICROSC-4C

MultiSizer, Coulter Counter

N/Protein Analysis

Nikon analysis software

Nikon scanning electron microscope

Nikon upright microscopes

Organic Elemental Analysis

PCT pro

Photonic Optics

Salt spray chambers

SENSYS EVO DSC

SENSYS EVO TG-DSC

SETSYS EVOLUTION TMA

SMX Small molecule X-ray

Stable Isotope Analysis

Stereo Microscopes

THEMYS HP TGA

THEMYS STA

TOC & Water Analysis

Vaper Pressure Analyser

Vi-Cell MetaFLEX

ViCell, Automated Cell Viability

X-300 - Multi-position Electric Fluxer

X-600 - 6 position Electric Fluxer

X-ray diffraction (XRD)

X-ray fluorescence (XRF)

XT H 450

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