Material Characterization

Material Characterization

 Rigaku
 SpexSmaplePrep
 Surface Measurement Systems
 VLM
 Beckman Coulter
 Nikon
Ramcon tilbyder forskelligt udstyr og tilbehør til materiale og partikel karakterisering og måling.
Partikelstørrelser, størrelsesfordelling, lysspredning, zetapotentiale, XRF, XRD, røngtendiffraktion, røngtenflourescence, frysemøller, fluxer, 
laser diffraktion, vapor sorption, adsorption/desoption, korrosionstest, saltspray test,krystalinitet, scanning elektron mikroskop, stereo mikroskop, måle mikroskoper, inverteret mikroskop og digitale mikroskoper.

Med vores mange specialister, serviceteknikere og supportere, hjælper vi vores kunder med at få udstyr og løsninger integreret i laboratoriet, så der opnåes hurtigere og bedre resultater. 

Products

6875 Large FreezerMill, single chamber

Advanced Cyclic Corrosion

Advantage Elevated Temperature

Andor Technology

Condensation chambers

CoolLed illumination

Coulter Counter, Z-series

Cylic Corrosion Tests (CCT)

DelsaMax Zetapotential

Dvs Advantage

DVS Intrinsic

DVS Vacuum

GenoGrinder 2010

iGC-SEA Surface Energy Analyzer

Inspectis C12

Kesternich (SO2) chambers

Laser Diffraction

MultiSizer, Coulter Counter

Nikon analysis software

Nikon mikroscope cameras

Nikon scanning electron microscope

Nikon upright microscopes

Photonic Optics

Salt spray chambers

SMX Small molecule X-ray

Vaper Pressure Analyser

ViCell, Automated Cell Viability

X-300 - Multi-position Electric Fluxer

X-600 - 6 position Electric Fluxer

X-ray diffraction (XRD)

X-ray fluorescence (XRF)

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