Material Characterization

Material Characterization

 Sentronic
 Indatech
 Setaram
 Nikon
 Beckman Coulter
 VLM
 Surface Measurement Systems
 SpexSmaplePrep
 Rigaku
Ramcon tilbyder forskelligt udstyr og tilbehør til materiale og partikel karakterisering og måling.
Partikelstørrelser, størrelsesfordelling, lysspredning, zetapotentiale, XRF, XRD, røngtendiffraktion, røngtenflourescence, frysemøller, fluxer, 
laser diffraktion, vapor sorption, adsorption/desoption, korrosionstest, saltspray test, krystalinitet, scanning elektron mikroskop, stereo mikroskop, måle mikroskoper, inverteret mikroskop og digitale mikroskoper.

Med vores mange specialister, serviceteknikere og supportere, hjælper vi vores kunder med at få udstyr og løsninger integreret i laboratoriet, så der opnåes hurtigere og bedre resultater. 

Products

6875 Large FreezerMill, single chamber

Advanced Cyclic Corrosion

Advantage Elevated Temperature

Condensation chambers

Cylic Corrosion Tests (CCT)

DelsaMax Zetapotential

DSC131 EVO

Dvs Advantage

DVS Intrinsic

DVS Vacuum

GenoGrinder 2010

iGC-SEA Surface Energy Analyzer

Inspectis C12

Kesternich (SO2) chambers

LABSYS EVO TGA

LS 13 320 XR - Laser Diffraction

MCT225

MICRODSC7 EVO

MICROSC-4C

MultiSizer, Coulter Counter

Nikon analysis software

Nikon mikroscope cameras

Nikon scanning electron microscope

Nikon stereomicroscopes

Nikon upright microscopes

PCT pro

Salt spray chambers

SENSYS EVO DSC

SENSYS EVO TG-DSC

SETSYS EVOLUTION TMA

SMX Small molecule X-ray

THEMYS HP TGA

THEMYS STA

Vapor Pressure Analyser

X-300 - Multi-position Electric Fluxer

X-600 - 6 position Electric Fluxer

X-ray diffraction (XRD)

X-ray fluorescence (XRF)

XT H 450

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